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Electrical properties of CdTe:P single crystals at low and high temperatures

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Author
Fochuk, Petro
Sniala, Yuliia
Armani, Nicola
Grill, RomanORCiD Profile - 0000-0002-4615-8909WoS Profile - A-2109-2008Scopus Profile - 10039402900

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Publication date
2024
Published in
Fìzika ì chìmìja tverdogo tìla
Volume / Issue
25 (2)
ISBN / ISSN
ISSN: 1729-4428
ISBN / ISSN
eISSN: 2309-8589
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  • Faculty of Mathematics and Physics

This publication has a published version with DOI 10.15330/pcss.25.2.352-361

Abstract
High-temperature (470-1170 K) properties of CdTe:P single crystals, grown by Bridgman technique, with an initial concentration of impurities in the melt 1x10(19) at/cm(3), were investigated by measuring of the Hall effect. Experimental results indicate that up to the temperature of similar to 700 K samples had p-type conductivity and above similar to 940 K - n-type one. Character of isothermal dependences of Hall constant strongly differs from the dependence of the undoped material due to the influence of impurities. Acceptor effect of phosphorus is observed up to 1170 K, it shows a high content of acceptor impurity form (P-Te). The low-temperature electric measurements data confirm the fact of phosphorus high solubility in CdTe. The results of IR microscopy indicate that the introduction of phosphorus into CdTe crystal resulted in almost complete eliminatio n of second phase inclusions with size >= 1 mu m, which are usually present in such material.
Keywords
cadmium telluride, phosphorus, Hall effect, point defects, high-temperature measurements
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https://hdl.handle.net/20.500.14178/2925
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WOS:001265570800018
SCOPUS:2-s2.0-85201201807
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Full text of this result is licensed under: Creative Commons Uveďte původ 3.0 Unported

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