Vážení uživatelé, vítáme Vás v nové podobě uživatelského rozhraní Repozitáře publikační činnosti UK. Budeme rádi, když nám věnujete chvíli Vašeho času a poskytnete nám k nové podobě repozitáře zpětnou vazbu.

Dear users, welcome to the new interface of the Charles University Publication Repository. We would appreciate it if you could take a moment of your time to provide us with feedback on the new design of the repository.

Dotazník pro zpětnou vazbu je dostupný na URL adrese / The feedback questionnaire is available at the URL address: https://forms.office.com/e/ueBL8SYPZt

Zobrazit minimální záznam

Improvement of the signal to noise ratio for fluorescent imaging in microfluidic chips

dc.contributor.authorLiu, Xiaocheng
dc.contributor.authorZhu, Hanliang
dc.contributor.authorSabó, Ján
dc.contributor.authorLánský, Zdeněk
dc.contributor.authorNeužil, Pavel
dc.date.accessioned2023-03-28T09:10:31Z
dc.date.available2023-03-28T09:10:31Z
dc.date.issued2022
dc.identifier.urihttps://hdl.handle.net/20.500.14178/1822
dc.description.abstractMicrofluidics systems can be fabricated in various ways using original silicon glass systems, with easy Si processing and surface modifications for subsequent applications such as cell seeding and their study. Fluorescent imaging of cells became a standard technique for the investigation of cell behavior. Unfortunately, high sensitivity fluorescent imaging, e.g., using total internal reflection fluorescence (TIRF) microscopy, is problematic in these microfluidic systems because the uneven surfaces of the silicon channels' bottoms affect light penetration through the optical filters. In this work, we study the nature of the phenomenon, finding that the problem can be rectified by using a silicon-on-insulator (SOI) substrate, defining the channel depth by the thickness of the top Si layer, and halting the etching at the buried SiO2 layer. Then the fluorescent background signal drops by = 5 times, corresponding to the limit of detection drop from = 0.05 mM to = 50 nM of fluorescein. We demonstrate the importance of a flat surface using TIRF-based single-molecule detection, improving the signal to a noise ratio more than 18 times compared to a conventional Si wafer. Overall, using very high-quality SOI substrates pays off, as it improves the fluorescence image quality due to the increase in signal-to-noise ratio. Concerning the cost of microfluidic device fabrication-design, mask fabrication, wafer processing, and device testing-the initial SOI wafer cost is marginal, and using it improves the system performance.en
dc.language.isoen
dc.relation.urlhttps://doi.org/10.1038/s41598-022-23426-z
dc.rightsCreative Commons Uveďte původ 4.0 Internationalcs
dc.rightsCreative Commons Attribution 4.0 Internationalen
dc.titleImprovement of the signal to noise ratio for fluorescent imaging in microfluidic chipsen
dcterms.accessRightsopenAccess
dcterms.licensehttps://creativecommons.org/licenses/by/4.0/legalcode
dc.date.updated2023-10-02T06:15:44Z
dc.subject.keywordelectrochemical impedance spectroscopyen
dc.subject.keywordX-ray-fluorescenceen
dc.subject.keywordsurface-roughnessen
dc.subject.keywordelectrochemiluminescenceen
dc.subject.keywordproteinsen
dc.subject.keywordprogressen
dc.relation.fundingReferenceinfo:eu-repo/grantAgreement/UK/PROGRES/Q46
dc.relation.fundingReferenceinfo:eu-repo/grantAgreement/UK/SVV/SVV260567
dc.relation.fundingReferenceinfo:eu-repo/grantAgreement/UK/GAUK/GAUK276321
dc.relation.fundingReferenceinfo:eu-repo/grantAgreement/MSM/LM/LM2018129
dc.relation.fundingReferenceinfo:eu-repo/grantAgreement/MSM/EF/EF18_046/0016045
dc.relation.fundingReferenceinfo:eu-repo/grantAgreement/UK/COOP/COOP
dc.date.embargoStartDate2023-10-02
dc.type.obd73
dc.type.versioninfo:eu-repo/semantics/publishedVersion
dc.identifier.doi10.1038/s41598-022-23426-z
dc.identifier.utWos000879914800037
dc.identifier.eidScopus2-s2.0-85141545710
dc.identifier.obd623600
dc.identifier.rivRIV/00216208:11310/22:10455940
dc.identifier.pubmed36344576
dc.subject.rivPrimary10000::10400::10403
dcterms.isPartOf.nameScientific Reports
dcterms.isPartOf.issn2045-2322
dcterms.isPartOf.journalYear2022
dcterms.isPartOf.journalVolume12
dcterms.isPartOf.journalIssue1
uk.faculty.primaryId115
uk.faculty.primaryNamePřírodovědecká fakultacs
uk.faculty.primaryNameFaculty of Scienceen
uk.department.primaryId1049
uk.department.primaryNameKatedra fyzikální a makromolekulární chemiecs
uk.department.primaryNameDepartment of Physical and Macromolecular Chemistryen
uk.department.secondaryId1035
uk.department.secondaryNameKatedra buněčné biologiecs
uk.department.secondaryNameDepartment of Cell Biologyen
dc.type.obdHierarchyCsČLÁNEK V ČASOPISU::článek v časopisu::původní článekcs
dc.type.obdHierarchyEnJOURNAL ARTICLE::journal article::original articleen
dc.type.obdHierarchyCode73::152::206en
uk.displayTitleImprovement of the signal to noise ratio for fluorescent imaging in microfluidic chipsen


Soubory tohoto záznamu

Thumbnail

Tento záznam se objevuje v následujících kolekcích

Zobrazit minimální záznam